As for this week, I took the pictures of the 4N&2N wires in the FA lab using the SEM machines. Next, I was told to run a total of 47 leadframes in order to check the leadframes' decolouration problem. As a result, no problem was detected after performing X-Ray for the wires. But it was very time consuming.
This week, unfortunately, a exposed pad case was detected, but only 1 unit in the whole lot. Therefore, I keyed in information into the time mapping summary. Micron's team, our new company boss visited our site this week, our company gave them a warm welcome to Muar.
The team gave all the staff a briefing session about Micron.
I was assigned to find out what is ball shear, ball height, loop height, die shear and also pull test. There is a spec parameter for each of the category. Besides that, I also helped to keyed in the Statical Process Control (SPC) data into the Datalyzer spectrum database. The purpose of the data was to monitor the quality of the product by looking at the graph presented by the keyed in data. The QA department staff will make improvement base on the SPC graph. There was Upper & Lower limit for the SPC value, if it was to exceed the limit, actions must be taken to solve the problems.
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